A Highly Efficient Blind Image Quality Assessment Metric of 3-D Synthesized Images Using Outlier Detection

出版年份 2018 全文链接

标题

作者

关键词

出版物

Volume 15, Issue 7, Pages 4120-4128

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2018-12-21

DOI

10.1109/tii.2018.2888861

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now