Nature of vacuum-deposited electrode induced thermal irradiation damage on organic transistors

出版年份 2019 全文链接

标题

作者

关键词

Organic field-effect transistor, Thermal irradiation damage, Contact resistance, Kelvin probe force microscopy, Injection barrier, Structure defects

出版物

APPLIED SURFACE SCIENCE

Volume 480, Issue -, Pages 523-528

出版商

Elsevier BV

发表日期

2019-03-02

DOI

10.1016/j.apsusc.2019.03.012

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