Program/Erase Cycling Degradation Mechanism of HfO2-Based FeFET Memory Devices

出版年份 2019 全文链接

标题

Program/Erase Cycling Degradation Mechanism of HfO2-Based FeFET Memory Devices

作者

关键词

-

出版物

IEEE ELECTRON DEVICE LETTERS

Volume 40, Issue 5, Pages 710-713

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2019-03-29

DOI

10.1109/led.2019.2908084

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