期刊
2D MATERIALS
卷 6, 期 3, 页码 -出版社
IOP Publishing Ltd
DOI: 10.1088/2053-1583/ab1457
关键词
van der Waals heterojunction; bipolar transistors; black phosphorus; MoS2; current gain
资金
- National Research Foundation of Korea (NRF) - Ministry of Education [2018K1A4A3A01064272]
- Ministry of Science and ICT
- Priority Research Center Program [2010-0020207]
- Basic Science Research Program [2016R1D1A1A09917762]
Ultrathin and light heterojunction bipolar transistors based on two-dimensional (2D) layered materials with flexible semiconducting properties have been considered for several electronic applications. In this paper, a van der Waals p-BP/n-MoS2/p-BP BJT is demonstrated. It is fabricated using mechanical exfoliation, where a dry transfer technique is used to stack a vertical double heterojunction. The device structure includes nanoflakes of black phosphorus (BP) and MoS2. The current-voltage characteristics of the common-emitter and common-base configurations are examined. These p-BP/n-MoS2/p-BP bipolar transistors exhibit current-voltage characteristics similar to those of conventional p-n-p bipolar transistors. Devices with thin MoS2 layers show good saturation current-voltage characteristics, and a maximum common-emitter current gain (beta = I-C/I-B) of approximately 10.1 is obtained at room temperature (300 K). Furthermore, the thickness dependence of the base region (n-MoS2) is investigated for the common-emitter output electrical characteristics (V-CE-I-C) of a double heterojunction bipolar transistor in which the emitter is grounded. The collector current decreases as the thickness of n-MoS2 is increased. This study can pave the way for the application of 2D materials as controllable amplifiers in flexible electronics.
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