Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale

出版年份 2018 全文链接

标题

作者

关键词

Geometrically necessary dislocations, EBSD, TEM, Nanostructure, TKD

出版物

Volume 197, Issue -, Pages 39-45

出版商

Elsevier BV

发表日期

2018-11-22

DOI

10.1016/j.ultramic.2018.11.011

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