The maximum a posteriori probability rule for atom column detection from HAADF STEM images

出版年份 2019 全文链接

标题

作者

关键词

Scanning transmission electron microscopy (STEM), Atom detection, Atom detectability, Model selection

出版物

Volume -, Issue -, Pages -

出版商

Elsevier BV

发表日期

2019-02-04

DOI

10.1016/j.ultramic.2019.02.003

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