期刊
SCRIPTA MATERIALIA
卷 162, 期 -, 页码 266-271出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2018.11.030
关键词
HR-EBSD; EBSD; Grain boundaries; Crystal symmetry; Absolute stress; Pattern center
类别
资金
- ONR Vannevar Bush Faculty Fellowship [N00014-16-1-2821]
We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 10(-4) in strain), 7 x 10(-5) rad and 0.06 pixels. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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