期刊
PROGRESS IN PHOTOVOLTAICS
卷 27, 期 5, 页码 460-468出版社
WILEY
DOI: 10.1002/pip.3121
关键词
dark lock-in thermography; electroluminescence; imaging; organic solar cells; photoluminescence; quality control
资金
- Deutsche Forschungsgemeinschaft (DFG) [BR 4031/6-1]
- DFG [BR 4031/13-1, SFB 953]
- Bavarian Ministry of Economic Affairs and Media, Energy and Technology - HI-ERN of FZ Julich [IEK11]
- Aufbruch Bayern initiative of the state of Bavaria (EnCN)
- Aufbruch Bayern initiative of the state of Bavaria (Solar Factory of the Future)
- Bavarian Initiative Solar Technologies go Hybrid (SolTech)
- Bavarian State Government as part of the Energy Campus Nuremberg [FKZ 20.2-3410.5-4-5]
An important aspect when upscaling organic photovoltaics from laboratory to industrial scale is quality control. Established imaging techniques like lock-in thermography or luminescence imaging are frequently used for this purpose. While these techniques allow for the lateral detection of defects, they cannot provide information on the vertical position of the defect in the OPV stack. Here, we present an approach to overcome this limitation. A femtosecond-laser is deployed to introduce well-defined artificial calibration defects selectively into both the interface and the bulk active layer of inverted P3HT:PCBM bulk heterojunction cells during device fabrication. The defective cells are then characterized using J-V analysis and several nondestructive imaging methods (dark lock-in thermography, photoluminescence, and electroluminescence imaging). The distinct response for each defect in the different imaging methods enables us to uniquely distinguish between bulk and interface defects. This allows to study surface recombination under most controlled conditions.
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