Single particle transient response and displacement damage in CMOS image sensors induced by high energy neutrons at Back-n in CSNS facility

出版年份 2018 全文链接

标题

作者

关键词

Spallation neutron source, CMOS image sensor (CIS), Single particle transient response, Displacement damage, Neutron radiation

出版物

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Volume 920, Issue -, Pages 68-72

出版商

Elsevier BV

发表日期

2018-12-25

DOI

10.1016/j.nima.2018.12.033

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