Global optimum of microstructure parameters in the CMWP line-profile-analysis method by combining Marquardt-Levenberg and Monte-Carlo procedures

出版年份 2019 全文链接

标题

作者

关键词

X-ray line profile analysis, neutron line profile analysis, CMWP, global optimum, dislocation densities, grain size, planar defects, Monte-Carlo method

出版物

JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY

Volume -, Issue -, Pages -

出版商

Elsevier BV

发表日期

2019-01-24

DOI

10.1016/j.jmst.2019.01.014

向作者/读者发起求助以获取更多资源

Protocol

在线求助

Reagent

在线求助

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started