Identification of the nature of traps involved in the field cycling of Hf0.5Zr0.5O2-based ferroelectric thin films

出版年份 2018 全文链接

标题

作者

关键词

Ferroelectric Hf, 0.5, Zr, 0.5, O, 2, Defects, Luminescence, Oxygen vacancies, Leakage currents

出版物

Volume 166, Issue -, Pages 47-55

出版商

Elsevier BV

发表日期

2018-12-12

DOI

10.1016/j.actamat.2018.12.008

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