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A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability

期刊

ELECTRONICS
卷 7, 期 12, 页码 -

出版社

MDPI
DOI: 10.3390/electronics7120377

关键词

AlGaN; GaN; high-electron mobility transistor (HEMTs); p-GaN; enhancement-mode

资金

  1. Research of Low Cost Fabrication of GaN Power Devices and System Integration [JCYJ20160226192639004]
  2. Research of AlGaN HEMT MEMS Sensor for Work in Extreme Environment [JCYJ20170412153356899]
  3. Research of the Reliability Mechanism and Circuit Simulation of GaN HEMT [2017A050506002]

向作者/读者索取更多资源

GaN based high electron mobility transistors (HEMTs) have demonstrated extraordinary features in the applications of high power and high frequency devices. In this paper, we review recent progress in AlGaN/GaN HEMTs, including the following sections. First, challenges in device fabrication and optimizations will be discussed. Then, the latest progress in device fabrication technologies will be presented. Finally, some promising device structures from simulation studies will be discussed.

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