X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 x 500 x 12.5 mu m(3) foils, 20 mu m diameter wire, and > 10 mu m diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 mu m copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 x 40 mu m) and double (4 x 25 mu m) copper x-pinches were driven at similar to 1 kA/ns. Moir ' e fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast. Published by AIP Publishing.