Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test

Remaining Useful Life Prediction for Degradation Processes With Memory Effects

(2017) Xiaopeng Xi et al.   IEEE TRANSACTIONS ON RELIABILITY

Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures

(2017) Yashun Wang et al.   QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL

Partial accelerated degradation test plans for Wiener degradation processes

(2017) Heonsang Lim et al.   Quality Technology and Quantitative Management

Thermal degradation kinetics of LED lamps in step-up-stress and step-down-stress accelerated degradation testing

(2016) Miao Cai et al.   APPLIED THERMAL ENGINEERING

An Extended Design Methodology for LED Lighting Systems Including Lifetime Estimation

(2016)   IEEE TRANSACTIONS ON ELECTRON DEVICES

Low Stress Cycle Effect in IGBT Power Module Die-Attach Lifetime Modeling

(2016) Wei Lai et al.   IEEE TRANSACTIONS ON POWER ELECTRONICS

An accelerated test method of luminous flux depreciation for LED luminaires and lamps

(2016) C. Qian et al.   RELIABILITY ENGINEERING & SYSTEM SAFETY

High-power UV-LED degradation: Continuous and cycled working condition influence

(2015) F.J. Arques-Orobon et al.   SOLID-STATE ELECTRONICS

Useful lifetime analysis for high-power white LEDs

(2014) Fu-Kwun Wang et al.   MICROELECTRONICS RELIABILITY

Optimal design of accelerated life tests for an extension of the exponential distribution

(2014) Firoozeh Haghighi   RELIABILITY ENGINEERING & SYSTEM SAFETY

Lifetime Estimation of High-Power White LED Using Degradation-Data-Driven Method

(2012) Jiajie Fan et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Estimating the parameters of Weibull distribution and the acceleration factor from hybrid partially accelerated life test

(2011) Ali A. Ismail   APPLIED MATHEMATICAL MODELLING

Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests

(2010) Jong In Park et al.   IEEE TRANSACTIONS ON RELIABILITY