Direct comparison of shadowgraphy and x-ray imaging for void fraction determination

标题
Direct comparison of shadowgraphy and x-ray imaging for void fraction determination
作者
关键词
-
出版物
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 29, Issue 12, Pages 125303
出版商
IOP Publishing
发表日期
2018-10-23
DOI
10.1088/1361-6501/aaea49

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