Long range, non-destructive characterization of GaN substrates for power devices

出版年份 2018 全文链接

标题

作者

关键词

A1 Substrates, A1 Defects, A1 Optical microscopy, A1 Spectroscopy, B1 Gallium compounds, B1 Nitrides

出版物

Volume 506, Issue -, Pages 178-184

出版商

Elsevier BV

发表日期

2018-10-19

DOI

10.1016/j.jcrysgro.2018.10.032

联系作者

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