Nano-palpation AFM and its quantitative mechanical property mapping

标题
Nano-palpation AFM and its quantitative mechanical property mapping
作者
关键词
-
出版物
Microscopy
Volume 63, Issue 3, Pages 193-208
出版商
Oxford University Press (OUP)
发表日期
2014-04-26
DOI
10.1093/jmicro/dfu009

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started