Sensing Microwave-Terahertz Detectors Based on Metal-Semiconductor-Metal Structures With Symmetrical I–V Characteristic

标题
Sensing Microwave-Terahertz Detectors Based on Metal-Semiconductor-Metal Structures With Symmetrical I–V Characteristic
作者
关键词
-
出版物
IEEE Journal of the Electron Devices Society
Volume 1, Issue 3, Pages 76-82
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2013-03-12
DOI
10.1109/jeds.2013.2252235

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