4.2 Article

Scanning force microscope for in situ nanofocused X-ray diffraction studies

期刊

JOURNAL OF SYNCHROTRON RADIATION
卷 21, 期 -, 页码 1128-1133

出版社

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577514014532

关键词

in situ atomic force microscopy; nanofocused X-ray diffraction; mechanical properties; nanostructure

资金

  1. French National Research Agency [ANR-11-BS10-01401 MecaniX]
  2. European Synchrotron Radiation Facility (ESRF)

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A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.

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