4.2 Article

Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

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JOURNAL OF SYNCHROTRON RADIATION
卷 21, 期 -, 页码 1-4

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INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577513023205

关键词

ultra-small-angle X-ray scattering; hierarchical structures; nanocomposites

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A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 mu m(-1) was thereby achieved at an X-ray energy of 8 keV.

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