The Diffraction Pattern Calculator(DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data

Probing the Self-Assembled Nanostructures of Functional Polymers with Synchrotron Grazing Incidence X-Ray Scattering

(2014) Moonhor Ree   MACROMOLECULAR RAPID COMMUNICATIONS

Predicting crystal structures of organic compounds

(2013) Sarah L. Price   CHEMICAL SOCIETY REVIEWS

CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose

(2013) Rafael P. Oliveira et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Refinement of macromolecular structures against neutron data withSHELXL2013

(2013) Tim Gruene et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport

(2012) Ruipeng Li et al.   ADVANCED MATERIALS

Guiding Crystallization around Bends and Sharp Corners

(2012) Stephanie S. Lee et al.   ADVANCED MATERIALS

Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD

(2012) Sebastian Send et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films

(2012) Enrico Fumagalli et al.   JOURNAL OF SYNCHROTRON RADIATION

TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy

(2012) Yijin Liu et al.   JOURNAL OF SYNCHROTRON RADIATION

Orientation-Independent Charge Transport in Single Spherulites from Solution-Processed Organic Semiconductors

(2012) Stephanie S. Lee et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Controlling the Microstructure of Solution-Processable Small Molecules in Thin-Film Transistors through Substrate Chemistry

(2011) R. Joseph Kline et al.   CHEMISTRY OF MATERIALS

Quantitative analysis of lattice disorder and crystallite size in organic semiconductor thin films

(2011) Jonathan Rivnay et al.   PHYSICAL REVIEW B

On the allowed values for the triclinic unit-cell angles

(2010) James Foadi et al.   ACTA CRYSTALLOGRAPHICA SECTION A

Thin Film Structure of Triisopropylsilylethynyl-Functionalized Pentacene and Tetraceno[2,3-b]thiophene from Grazing Incidence X-Ray Diffraction

(2010) Stefan C. B. Mannsfeld et al.   ADVANCED MATERIALS

Molecular Characterization of Organic Electronic Films

(2010) Dean M. DeLongchamp et al.   ADVANCED MATERIALS

The software packageANAELUfor X-ray diffraction analysis using two-dimensional patterns

(2010) Luis Fuentes-Montero et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

(2010) Jessy L. Baker et al.   LANGMUIR

Unusual Molecular Conformations in Fluorinated, Contorted Hexabenzocoronenes

(2010) Yueh-Lin Loo et al.   ORGANIC LETTERS

Structural Complexities in the Active Layers of Organic Electronics

(2010) Stephanie S. Lee et al.   Annual Review of Chemical and Biomolecular Engineering

Correlating Nanomorphology with Charge-Transport Anisotropy in Conjugated-Polymer Thin Films

(2009) Yi-Fang Huang et al.   ADVANCED MATERIALS

Interplay between Energetic and Kinetic Factors on the Ambient Stability of n-Channel Organic Transistors Based on Perylene Diimide Derivatives

(2009) Joon Hak Oh et al.   CHEMISTRY OF MATERIALS

Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

(2009) Detlef-M. Smilgies   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

(2008) Lucile C. Teague et al.   ADVANCED MATERIALS

Simulating X-ray diffraction of textured films

(2008) Dag W. Breiby et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Surface induced crystallographic order in sexiphenyl thin films

(2008) R Resel   JOURNAL OF PHYSICS-CONDENSED MATTER