Compact MOSFET Modeling for Process Variability-Aware VLSI Circuit Design

Considerations for Ultimate CMOS Scaling

(2012) K. J. Kuhn   IEEE TRANSACTIONS ON ELECTRON DEVICES

On the Variability in Planar FDSOI Technology: From MOSFETs to SRAM Cells

(2011) Jérôme Mazurier et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Process Technology Variation

(2011) Kelin J. Kuhn et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Characterization and Modeling of Transistor Variability in Advanced CMOS Technologies

(2011) Cecilia Maggioni Mezzomo et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Extensions to Backward Propagation of Variance for Statistical Modeling

(2010) Colin C. McAndrew et al.   IEEE DESIGN & TEST OF COMPUTERS

Modeling Process Variability in Scaled CMOS Technology

(2010) Samar K. Saha   IEEE DESIGN & TEST OF COMPUTERS

Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology

(2009) Liang-Teck Pang et al.   IEEE JOURNAL OF SOLID-STATE CIRCUITS

Performance-Aware Corner Model for Design for Manufacturing

(2009) Chung-Hsun Lin et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES