标题
Nanofocusing of X-ray free-electron lasers by grazing-incidence reflective optics
作者
关键词
-
出版物
JOURNAL OF SYNCHROTRON RADIATION
Volume 22, Issue 3, Pages 592-598
出版商
International Union of Crystallography (IUCr)
发表日期
2015-04-15
DOI
10.1107/s1600577515005093
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Generation of 1020 W cm−2 hard X-ray laser pulses with two-stage reflective focusing system
- (2014) Hidekazu Mimura et al. Nature Communications
- Methodology for optimalin situalignment and setting of bendable optics for nearly diffraction-limited focusing of soft x-rays
- (2013) Daniel J. Merthe et al. OPTICAL ENGINEERING
- Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser
- (2013) Takahisa Koyama et al. OPTICS EXPRESS
- X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer
- (2013) Hongchang Wang et al. OPTICS LETTERS
- Focusing of X-ray free-electron laser pulses with reflective optics
- (2012) Hirokatsu Yumoto et al. Nature Photonics
- A compact X-ray free-electron laser emitting in the sub-ångström region
- (2012) Tetsuya Ishikawa et al. Nature Photonics
- Ion beam etching of a flat silicon mirror surface: A study of the shape error evolution
- (2012) I. Preda et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- At-wavelength metrology using the moiré fringe analysis method based on a two dimensional grating interferometer
- (2012) Hongchang Wang et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- In situ fine tuning of bendable soft x-ray mirrors using a lateral shearing interferometer
- (2012) Daniel J. Merthe et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry
- (2012) Satoshi Matsuyama et al. OPTICS EXPRESS
- Grating-based at-wavelength metrology of hard x-ray reflective optics
- (2012) Sebastien Berujon et al. OPTICS LETTERS
- Determination of the Pulse Duration of an X-Ray Free Electron Laser Using Highly Resolved Single-Shot Spectra
- (2012) Yuichi Inubushi et al. PHYSICAL REVIEW LETTERS
- Exploring the wavefront of hard X-ray free-electron laser radiation
- (2012) Simon Rutishauser et al. Nature Communications
- At-wavelength characterization of refractive x-ray lenses using a two-dimensional grating interferometer
- (2011) Simon Rutishauser et al. APPLIED PHYSICS LETTERS
- X-ray wavefront characterization using a rotating shearing interferometer technique
- (2011) Hongchang Wang et al. OPTICS EXPRESS
- Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
- (2010) Ana Diaz et al. JOURNAL OF SYNCHROTRON RADIATION
- First lasing and operation of an ångstrom-wavelength free-electron laser
- (2010) P. Emma et al. Nature Photonics
- Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror
- (2010) Sheng Yuan et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- Breaking the 10 nm barrier in hard-X-ray focusing
- (2009) Hidekazu Mimura et al. Nature Physics
- Direct determination of the wave field of an x-ray nanobeam
- (2008) Hidekazu Mimura et al. PHYSICAL REVIEW A
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started