4.6 Article

Atmospheric pressure chemical vapor deposition of high silica SiO2-TiO2 antireflective thin films for glass based solar panels

期刊

JOURNAL OF MATERIALS CHEMISTRY C
卷 1, 期 39, 页码 6188-6190

出版社

ROYAL SOC CHEMISTRY
DOI: 10.1039/c3tc31465k

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  1. U.S. Department of Energy, Assistant Secretary for Energy Efficiency and Renewable Energy, Solar Office [DE-AC05-00OR22725]
  2. UT-Battelle, LLC
  3. Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy

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The atmospheric pressure chemical vapor deposition (APCVD) of SiO2-TiO2 thin films on glass by employing a [[((BuO)-Bu-t)(3)SiO](2)-Ti((OPr)-Pr-i)(2)] single-source precursor, which can be prepared from commercially available materials, results in antireflective thin films with high silica SiO2 : TiO2 ratio (i.e. SiO2 > 1) on float glass under industrially relevant manufacturing conditions.

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