Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation

标题
Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation
作者
关键词
-
出版物
IEEE Journal of Photovoltaics
Volume 3, Issue 4, Pages 1319-1324
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2013-07-06
DOI
10.1109/jphotov.2013.2270354

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