Studying Light-Induced Degradation by Lifetime Decay Analysis: Excellent Fit to Solution of Simple Second-Order Rate Equation

标题
Studying Light-Induced Degradation by Lifetime Decay Analysis: Excellent Fit to Solution of Simple Second-Order Rate Equation
作者
关键词
-
出版物
IEEE Journal of Photovoltaics
Volume 3, Issue 4, Pages 1265-1270
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2013-08-30
DOI
10.1109/jphotov.2013.2278663

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