4.4 Article

Resistive switching properties of Ce and Mn co-doped BiFeO3 thin films for nonvolatile memory application

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AIP ADVANCES
卷 3, 期 12, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.4860950

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资金

  1. National Natural Science Foundation of China (NSFC) [11032010]
  2. NSFC [61274107, 61176093, 11275163]
  3. PCSIRT [IRT1080]
  4. 973 Program [2012CB326404]
  5. Hunan Provincial NSFC [13JJ2023]
  6. Key Project of Scientific Research Fund of Hunan Provincial Education Department [12A129]
  7. Hunan Provincial Innovation Foundation for Postgraduate [CX2013B257, CX2013B261]
  8. Doctoral Program of Higher Education of China [20104301110001]
  9. Aid Program for Science and Technology Innovative Research Team in Higher Educational Institutions of Hunan Province
  10. Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory [ZHD201304]

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The Ce and Mn co-doped BiFeO3 (BCFMO) thin films were synthesized on Pt/Ti/SiO2/Si substrates using a sol-gel method. The unipolar resistive switching (URS) and bipolar resistive switching (BRS) behaviors were observed in the Pt/BCFMO/Pt device structure, which was attributed to the formation/rupture of metal filaments. The fabricated device exhibits a large R-OFF/R-ON ratio (>80), long retention time (>10(5) s) and low programming voltages (<1.5 V). Analysis of linear fitting current-voltage curves suggests that the space charge limited leakage current (SCLC) and Schottky emission were observed as the conduction mechanisms of the devices. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.

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