Measuring Working Memory With Digit Span and the Letter-Number Sequencing Subtests From the WAIS-IV: Too Low Manipulation Load and Risk for Underestimating Modality Effects

标题
Measuring Working Memory With Digit Span and the Letter-Number Sequencing Subtests From the WAIS-IV: Too Low Manipulation Load and Risk for Underestimating Modality Effects
作者
关键词
-
出版物
Applied Neuropsychology-Adult
Volume 22, Issue 6, Pages 445-451
出版商
Informa UK Limited
发表日期
2015-04-25
DOI
10.1080/23279095.2014.992069

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