期刊
MATERIALS
卷 3, 期 6, 页码 3642-3653出版社
MDPI
DOI: 10.3390/ma3063642
关键词
DMS; XAFS; ZnO; vacancy; Ti
类别
资金
- A*STAR/MOE [RP3979908M]
- A*STAR [0121050038, R-144-000-106-305]
- NUS [C-380-003-003-001]
- NRF-CRP [NRF2008NRF-CRP002-024),]
- NUS YIA, NUS
- FRC
We present a comprehensive study on Ti-doped ZnO thin films using X-ray Absorption Fine Structure (XAFS) spectroscopy. Ti K edge XAFS spectra were measured to study the electronic and chemical properties of Ti ions in the thin films grown under different ambient atmospheres. A strong dependence of Ti speciation, composition, and local structures upon the ambient conditions was observed. The XAFS results suggest a major tetrahedral coordination and a 4+ valence state. The sample grown in a mixture of 80% Ar and 20% O-2 shows a portion of precipitates with higher coordination. A large distortion was observed by the Ti substitution in the ZnO lattice. Interestingly, the film prepared in 80% Ar, 20% O-2 shows the largest saturation magnetic moment of 0.827 +/- 0.013 mu(B)/Ti.
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