期刊
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
卷 1, 期 10, 页码 1594-1600出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCPMT.2011.2150223
关键词
Materials reliability; materials science and technology; soldering
类别
资金
- Enterprise Ireland [TD/06/348]
- Science Foundation Ireland [03/CE3/I405]
- Alcatel-Lucent Bell Laboratories, Murray Hill, NJ
- Flextronics, Singapore
The thermal fatigue performances of Sn98.5Ag1.0 Cu-0.5 (SAC105), Sn97.5Ag2.0Cu0.5 (SAC205), Sn96.5Ag3.0Cu0.5 (SAC305) and Sn95.5Ag4.0Cu0.5 (SAC405) solder alloys with Pb terminations were investigated by accelerated temperature cycling with and without thermal preconditioning. The performance of the SAC alloys was compared to eutectic SnPb and aged SAC alloys. The test vehicle consists of commercial 2512 ceramic chip resistors soldered to printed wiring boards using the different solder alloy compositions. The solder joints were monitored continuously during a thermal cycle of 0 degrees C-100 degrees C with a ramp rate of 9 degrees C/min and a 30 min dwell between temperature extremes. Failures were defined in accordance with the IPC-9701A industry test guidelines and failure data are reported as characteristic life eta (number of cycles to 63.2% failure) from a two-parameter Weibull distribution. The microstructural evolution was characterized using metallographic techniques and back-scattered scanning electron microscopy. The findings show that the lifetime of the alloys can be ranked as follows: SAC 305 similar to SAC 405 > SAC 205 > SAC105 > SAC305 aged > SAC105 aged > SnPb and to determine mechanisms of failure, electron microscopy analysis and fractography were performed on post-cycled components.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据