X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

标题
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge
作者
关键词
-
出版物
Beilstein Journal of Nanotechnology
Volume 3, Issue -, Pages 345-350
出版商
Beilstein Institut
发表日期
2012-04-25
DOI
10.3762/bjnano.3.39

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