4.4 Article

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

期刊

BEILSTEIN JOURNAL OF NANOTECHNOLOGY
卷 3, 期 -, 页码 824-830

出版社

BEILSTEIN-INSTITUT
DOI: 10.3762/bjnano.3.92

关键词

atomic force microscopy; electrochemical deposition; electrochemistry; nanoelectronics; nanofabrication; nanolithography; nanotechnology; MEMS and NEMS; reversible processes; scanning probe microscopy and lithography

资金

  1. Deutsche Forschungsgemeinschaft within the DFG-Center for Functional Nanostructures (CFN)
  2. Baden-Wuerttemberg Foundation within the Research Network of Excellence Functional Nanostructures

向作者/读者索取更多资源

We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a mechano-electrochemical pen, locally activating a passivated substrate surface for site-selective electrochemical deposition. Here, we demonstrate the reversibility of this process and study the long-term stability of the resulting metallic structures. The remarkable stability for more than 1.5 years under ambient air without any observable changes can be attributed to self-passivation. After AFM-activated electrochemical deposition of copper nanostructures on a polycrystalline gold film and subsequent AFM imaging, the copper nanostructures could be dissolved by reversing the electrochemical potential. Subsequent AFM-tip-activated deposition of different copper nanostructures at the same location where the previous structures were deleted, shows that there is no observable memory effect, i.e., no effect of the previous writing process on the subsequent writing process. Thus, the four processes required for reversible information storage, write, read, delete and re-write, were successfully demonstrated on the nanometer scale.

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