期刊
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS
卷 225, 期 2-3, 页码 110-124出版社
WALTER DE GRUYTER GMBH
DOI: 10.1524/zkri.2010.1162
关键词
Precession electron diffraction; Structural fingerprinting
资金
- Office of Naval Research
- Portland State University
The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.
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