Effects of buffer layer thickness on properties of ZnO thin films grown on porous silicon by plasma-assisted molecular beam epitaxy

出版年份 2012 全文链接

标题

Effects of buffer layer thickness on properties of ZnO thin films grown on porous silicon by plasma-assisted molecular beam epitaxy

作者

关键词

-

出版物

VACUUM

Volume 86, Issue 9, Pages 1373-1379

出版商

Elsevier BV

发表日期

2012-01-28

DOI

10.1016/j.vacuum.2012.01.006

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