期刊
ULTRAMICROSCOPY
卷 111, 期 9-10, 页码 1504-1511出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2011.06.002
关键词
Electron beam precession; Electron tomography; Diffraction contrast; Transmission electron microscopy; Defects
类别
资金
- Spanish Ministry of Science and Innovation [CSD2009-00013, MAT2010-16407]
- Catalan Government [CTP-00018, 5GR2009-00035]
- TEM facilities of Science and Technical Centers of the Universitat de Barcelona (CCiT-UB)
- Spanish Government
- ICMAB-CSIC
The successful combination of electron beam precession and bright field electron tomography for 3D reconstruction is reported. Beam precession is demonstrated to be a powerful technique to reduce the contrast artifacts due to diffraction and curvature in thin foils. Taking advantage of these benefits, Precession assisted electron tomography has been applied to reconstruct the morphology of Sn precipitates embedded in an Al matrix, from a tilt series acquired in a range from +49 degrees to -61 degrees at intervals of 2 degrees and with a precession angle of 0.6 degrees in bright field mode. The combination of electron tomography and beam precession in conventional TEM mode is proposed as an alternative procedure to obtain 3D reconstructions of nano-objects without a scanning system or a high angle annular dark field detector. (C) 2011 Elsevier B.V. All rights reserved.
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