期刊
ULTRAMICROSCOPY
卷 111, 期 8, 页码 1037-1042出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2011.03.003
关键词
Cathodoluminescence; Scanning electron microscopy; Nanowire; Waveguide
类别
资金
- MEC [MAT2006-01259, MAT2009-07882, CSD 2009-00013]
- BSCH-UCM (Group) [910146]
Cathodoluminescence (CL) of Ga2O3 nanowires and planar microstructures has been studied in a scanning electron microscope, as a function of the orientation angle of the structures relative to the position of the light detection system in the microscope chamber. CL contrast shows a marked dependence on the detection angle due to the waveguiding behaviour of the structures. The angle resolved cathodoluminescence (ARCL) measurements enable to evaluate the optical losses of guided blue-ultraviolet light in nanowires with diameters in the sub-wavelength range, deposited on graphite tape or silicon. In planar, branched feather-like microstructures, ARCL images demonstrate the directional-dependant light guiding behaviour of the nano-branches. (C) 2011 Elsevier B.V. All rights reserved.
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