Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

标题
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 110, Issue 12, Pages 1443-1453
出版商
Elsevier BV
发表日期
2010-08-19
DOI
10.1016/j.ultramic.2010.08.001

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