4.4 Article

Displacement field measurement of metal sub-lattice in inversion domains of indium-doped zinc oxide

期刊

ULTRAMICROSCOPY
卷 110, 期 5, 页码 411-417

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ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2009.11.023

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Aberration-corrected TEM; Displacement field; In2O3-ZnO compounds

资金

  1. DFG [Ma 1020/13-1]

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The displacement field of the metal sub-lattice in homologous compounds In2O3(ZnO)(m), is investigated by means of aberration-corrected high-resolution transmission electron microscopy. The elastic state in these compounds is characterised by plane strain where little column bending occurs due to surface relaxation. The compound contains inversion domain boundaries (IDBs) on basal and pyramidal planes of ZnO where the displacements are concentrated. The structure is imaged in < 1 <(1)over bar> 0 0 > of ZnO with negative spherical aberration and using bright atom contrast condition. Local atomic shifts are measured with precision of ca. 5 picometres in real space with a peak finding algorithm. The strain tensor and lattice rotations are calculated from displacements displaying dilatation, shear and rotation at pyramidal IDBs which reveal a mirror plane through the centre of each inversion domain. (C) 2009 Elsevier B.V. All rights reserved.

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