Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces

标题
Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 108, Issue 5, Pages 494-501
出版商
Elsevier BV
发表日期
2007-08-15
DOI
10.1016/j.ultramic.2007.08.007

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