Cryo DualBeam Focused Ion Beam–Scanning Electron Microscopy to Evaluate the Interface Between Cells and Nanopatterned Scaffolds

标题
Cryo DualBeam Focused Ion Beam–Scanning Electron Microscopy to Evaluate the Interface Between Cells and Nanopatterned Scaffolds
作者
关键词
-
出版物
TISSUE ENGINEERING PART C-METHODS
Volume 17, Issue 1, Pages 1-7
出版商
Mary Ann Liebert Inc
发表日期
2010-07-02
DOI
10.1089/ten.tec.2010.0251

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