Thermal Stresses in Layered Barium Titanate-Based Semiconductor Ceramics

Thermal stresses emerging in a barium titanate-based semiconducting ceramic during heating by electric current are studied using numerical methods. It is shown that the highest tensile stresses are formed in the plane equidistant from the electrodes. The values of these stresses can be as high as 70 MPa, which is commensurate with the critical stresses. A method is proposed for reducing stresses by developing thermistors with a layered structure.