4.4 Article

Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001)

期刊

SURFACE SCIENCE
卷 604, 期 19-20, 页码 1820-1824

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2010.07.013

关键词

NaCl layer; Image potential states; Moire pattern; Scanning tunneling microscopy

资金

  1. Chinese Academy of Sciences
  2. National Natural Science Foundation of China [10804121]

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Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V. and the Moire pattern induced by NaCl-Cu lattice mismatch also shows bias dependence. The z-V (dz/dV-V) curves and dl/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.

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