Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis

Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy

(2011) Yves Fleming et al.   APPLIED SURFACE SCIENCE

Use of a duoplasmatron ion source for negative ion generation

(2011) L. Pillatsch et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Advances in Imaging Secondary Ion Mass Spectrometry for Biological Samples

(2008) Steven G. Boxer et al.   Annual Review of Biophysics

Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy

(2008) Andreas Wucher et al.   APPLIED SURFACE SCIENCE

A high brightness source for nano-probe secondary ion mass spectrometry

(2008) N.S. Smith et al.   APPLIED SURFACE SCIENCE

Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS

(2008) J.L.S. Lee et al.   APPLIED SURFACE SCIENCE