Analysis of x-ray irradiation effect in high-kgate dielectrics by time-dependent photoemission spectroscopy using synchrotron radiation

出版年份 2008 全文链接

标题

Analysis of x-ray irradiation effect in high-kgate dielectrics by time-dependent photoemission spectroscopy using synchrotron radiation

作者

关键词

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出版物

SURFACE AND INTERFACE ANALYSIS

Volume 40, Issue 13, Pages 1606-1609

出版商

Wiley

发表日期

2008-11-19

DOI

10.1002/sia.2970

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