Atom probe specimen preparation and 3D interfacial study of Ti–Al–N thin films

标题
Atom probe specimen preparation and 3D interfacial study of Ti–Al–N thin films
作者
关键词
-
出版物
SURFACE & COATINGS TECHNOLOGY
Volume 204, Issue 11, Pages 1811-1816
出版商
Elsevier BV
发表日期
2009-11-17
DOI
10.1016/j.surfcoat.2009.11.020

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started