Microstructural characterisation of nanoparticles using, XRD line profiles analysis, FE-SEM and FT-IR

标题
Microstructural characterisation of nanoparticles using, XRD line profiles analysis, FE-SEM and FT-IR
作者
关键词
-
出版物
SUPERLATTICES AND MICROSTRUCTURES
Volume 45, Issue 6, Pages 576-582
出版商
Elsevier BV
发表日期
2009-03-07
DOI
10.1016/j.spmi.2009.02.004

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now