Experts’ knowledge renewal and maintenance actions effectiveness in high-mix low-volume industries, using Bayesian approach
出版年份 2015 全文链接
标题
Experts’ knowledge renewal and maintenance actions effectiveness in high-mix low-volume industries, using Bayesian approach
作者
关键词
Maintenance optimization, Dynamic knowledge management, Bayesian network, FMECA, High-mix low-volume production
出版物
Cognition Technology & Work
Volume 18, Issue 1, Pages 193-213
出版商
Springer Nature
发表日期
2015-10-19
DOI
10.1007/s10111-015-0354-y
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Industrial system knowledge formalization to aid decision making in maintenance strategies assessment
- (2015) G. Medina-Oliva et al. ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE
- Reliability modelling and verification of manufacturing processes based on process knowledge management
- (2013) Wei Dai et al. INTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING
- Reliability centered maintenance optimization for power distribution systems
- (2013) B. Yssaad et al. INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS
- Towards Bayesian network methodology for predicting the equipment health factor of complex semiconductor systems
- (2013) Mohammed Farouk Bouaziz et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- Wafer Classification Using Support Vector Machines
- (2012) R. Baly et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- VM-Based Baseline Predictive Maintenance Scheme
- (2012) Yao-Sheng Hsieh et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Eradicating root causes of aviation maintenance errors: introducing the AMMP
- (2012) H. S. J. Rashid et al. Cognition Technology & Work
- Large-Scale Semiconductor Process Fault Detection Using a Fast Pattern Recognition-Based Method
- (2010) Qinghua Peter He et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Adaptive Mahalanobis Distance and $k$-Nearest Neighbor Rule for Fault Detection in Semiconductor Manufacturing
- (2010) Ghislain Verdier et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Queueing Model Improves IBM's Semiconductor Capacity and Lead-Time Management
- (2010) Steven M. Brown et al. INTERFACES
- Development of maintenance function performance measurement framework and indicators
- (2010) Peter Muchiri et al. INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS
- Empirical analysis of maintenance performance measurement in Belgian industries
- (2009) Peter N. Muchiri et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- Significant human risk factors in aircraft maintenance technicians
- (2009) Yu-Hern Chang et al. SAFETY SCIENCE
- Dynamic risk management unveil productivity improvements
- (2008) Aymen Mili et al. JOURNAL OF LOSS PREVENTION IN THE PROCESS INDUSTRIES
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