A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique

标题
A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
作者
关键词
-
出版物
SOLID-STATE ELECTRONICS
Volume 54, Issue 11, Pages 1384-1391
出版商
Elsevier BV
发表日期
2010-05-27
DOI
10.1016/j.sse.2010.04.046

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