Mobility extraction in SOI MOSFETs with sub 1nm body thickness

标题
Mobility extraction in SOI MOSFETs with sub 1nm body thickness
作者
关键词
-
出版物
SOLID-STATE ELECTRONICS
Volume 53, Issue 12, Pages 1246-1251
出版商
Elsevier BV
发表日期
2009-10-10
DOI
10.1016/j.sse.2009.09.017

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