Radiometric calibration of optical microscopy and microspectroscopy apparata over a broad spectral range using a special thin-film luminescence standard

Effects of inter-nanocrystal distance on luminescence quantum yield in ensembles of Si nanocrystals

(2014) J. Valenta et al.   APPLIED PHYSICS LETTERS

Fluorescent layers for characterization of sectioning microscopy with coverslip-uncorrected and water immersion objectives

(2014) A. Antonini et al.   OPTICS EXPRESS

Single-nanocrystal sensitivity achieved by enhanced upconversion luminescence

(2013) Jiangbo Zhao et al.   Nature Nanotechnology

Formation of size-controlled silicon nanocrystals in plasma enhanced chemical vapor deposition grown SiOxNy/SiO2 superlattices

(2011) A.M. Hartel et al.   THIN SOLID FILMS

Photometric calibration for quantitative spectral microscopy under transmitted illumination

(2010) J. THIGPEN et al.   JOURNAL OF MICROSCOPY

Reciprocity between electroluminescence and quantum efficiency used for the characterization of silicon solar cells

(2009) Thomas Kirchartz et al.   PROGRESS IN PHOTOVOLTAICS

Light-Emission Performance of Silicon Nanocrystals Deduced from Single Quantum Dot Spectroscopy

(2008) Jan Valenta et al.   ADVANCED FUNCTIONAL MATERIALS

Photographic diagnosis of crystalline silicon solar cells utilizing electroluminescence

(2008) Takashi Fuyuki et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Energy transfer in Er-dopedSiO2sensitized with Si nanocrystals

(2008) I. Izeddin et al.   PHYSICAL REVIEW B